当我的新硬盘不应该报告错误时,这意味着什么?


99

我刚刚在一台机器上安装了几个新的HDD,但我偶然发现其中一个报告了两个错误,因此我smartctl -x在其上运行并得到了以下信息:

smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-141-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Hitachi/HGST Ultrastar 7K4000
Device Model:     HGST HUS724040ALA640
Serial Number:    [REDACTED]
LU WWN Device Id: [REDACTED]
Firmware Version: MFAOAC50
User Capacity:    4,000,787,030,016 bytes [4.00 TB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    7200 rpm
Form Factor:      3.5 inches
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA8-ACS T13/1699-D revision 4
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Tue Jan  1 05:33:21 2019 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM feature is:   Disabled
Rd look-ahead is: Enabled
Write cache is:   Enabled
ATA Security is:  Disabled, NOT FROZEN [SEC1]
Wt Cache Reorder: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82) Offline data collection activity
                    was completed without error.
                    Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                    without error or no self-test has ever 
                    been run.
Total time to complete Offline 
data collection:        (   24) seconds.
Offline data collection
capabilities:            (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:    (   1) minutes.
Extended self-test routine
recommended polling time:    ( 543) minutes.
SCT capabilities:          (0x003d) SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  1 Raw_Read_Error_Rate     PO-R--   100   100   016    -    0
  2 Throughput_Performance  P-S---   138   138   054    -    74
  3 Spin_Up_Time            POS---   100   100   024    -    572
  4 Start_Stop_Count        -O--C-   100   100   000    -    8
  5 Reallocated_Sector_Ct   PO--CK   100   100   005    -    0
  7 Seek_Error_Rate         PO-R--   100   100   067    -    0
  8 Seek_Time_Performance   P-S---   142   142   020    -    25
  9 Power_On_Hours          -O--C-   100   100   000    -    520
 10 Spin_Retry_Count        PO--C-   100   100   060    -    0
 12 Power_Cycle_Count       -O--CK   100   100   000    -    8
192 Power-Off_Retract_Count -O--CK   100   100   000    -    16
193 Load_Cycle_Count        -O--C-   100   100   000    -    16
194 Temperature_Celsius     -O----   166   166   000    -    36 (Min/Max 22/56)
196 Reallocated_Event_Count -O--CK   100   100   000    -    0
197 Current_Pending_Sector  -O---K   100   100   000    -    0
198 Offline_Uncorrectable   ---R--   100   100   000    -    0
199 UDMA_CRC_Error_Count    -O-R--   200   200   000    -    0
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory Version 1
SMART           Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00       GPL,SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x03       GPL     R/O      1  Ext. Comprehensive SMART error log
0x04       GPL     R/O      7  Device Statistics log
0x06           SL  R/O      1  SMART self-test log
0x07       GPL     R/O      1  Extended self-test log
0x08       GPL     R/O      2  Power Conditions log
0x09           SL  R/W      1  Selective self-test log
0x10       GPL     R/O      1  SATA NCQ Queued Error log
0x11       GPL     R/O      1  SATA Phy Event Counters log
0x20       GPL     R/O      1  Streaming performance log [OBS-8]
0x21       GPL     R/O      1  Write stream error log
0x22       GPL     R/O      1  Read stream error log
0x80-0x9f  GPL,SL  R/W     16  Host vendor specific log
0xe0       GPL,SL  R/W      1  SCT Command/Status
0xe1       GPL,SL  R/W      1  SCT Data Transfer

SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
Device Error Count: 2
    CR     = Command Register
    FEATR  = Features Register
    COUNT  = Count (was: Sector Count) Register
    LBA_48 = Upper bytes of LBA High/Mid/Low Registers ]  ATA-8
    LH     = LBA High (was: Cylinder High) Register    ]   LBA
    LM     = LBA Mid (was: Cylinder Low) Register      ] Register
    LL     = LBA Low (was: Sector Number) Register     ]
    DV     = Device (was: Device/Head) Register
    DC     = Device Control Register
    ER     = Error register
    ST     = Status register
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 [1] occurred at disk power-on lifetime: 16878 hours (703 days + 6 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  40 -- 51 00 0f 00 01 12 cd a0 31 02 00  Error: UNC at LBA = 0x112cda031 = 4610433073

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  60 00 10 00 10 00 01 12 cd a0 30 40 00  1d+08:13:30.021  READ FPDMA QUEUED
  61 00 10 00 00 00 01 12 63 a0 30 40 00  1d+08:13:30.021  WRITE FPDMA QUEUED
  60 00 10 00 00 00 01 12 cc a0 30 40 00  1d+08:13:30.017  READ FPDMA QUEUED
  61 00 10 00 10 00 01 12 62 a0 30 40 00  1d+08:13:30.011  WRITE FPDMA QUEUED
  60 00 10 00 00 00 01 12 cb a0 30 40 00  1d+08:13:30.004  READ FPDMA QUEUED

Error 1 [0] occurred at disk power-on lifetime: 10610 hours (442 days + 2 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER -- ST COUNT  LBA_48  LH LM LL DV DC
  -- -- -- == -- == == == -- -- -- -- --
  40 -- 51 01 34 00 01 12 f9 3a fc 02 00  Error: UNC at LBA = 0x112f93afc = 4613290748

  Commands leading to the command that caused the error were:
  CR FEATR COUNT  LBA_48  LH LM LL DV DC  Powered_Up_Time  Command/Feature_Name
  -- == -- == -- == == == -- -- -- -- --  ---------------  --------------------
  60 00 08 00 10 00 00 00 00 01 2c 40 00  2d+01:26:34.533  READ FPDMA QUEUED
  61 00 10 00 08 00 00 57 04 60 00 40 00  2d+01:26:33.675  WRITE FPDMA QUEUED
  60 02 00 00 00 00 01 12 f9 3a 30 40 00  2d+01:26:33.386  READ FPDMA QUEUED
  60 02 00 00 00 00 01 12 f9 38 30 40 00  2d+01:26:33.384  READ FPDMA QUEUED
  60 02 00 00 00 00 01 12 f9 36 30 40 00  2d+01:26:33.382  READ FPDMA QUEUED

SMART Extended Self-test Log Version: 1 (1 sectors)
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%     26741         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

SCT Status Version:                  3
SCT Version (vendor specific):       256 (0x0100)
SCT Support Level:                   1
Device State:                        Active (0)
Current Temperature:                    36 Celsius
Power Cycle Min/Max Temperature:     35/38 Celsius
Lifetime    Min/Max Temperature:     22/56 Celsius
Under/Over Temperature Limit Count:   0/0

SCT Temperature History Version:     2
Temperature Sampling Period:         1 minute
Temperature Logging Interval:        1 minute
Min/Max recommended Temperature:      0/60 Celsius
Min/Max Temperature Limit:           -40/70 Celsius
Temperature History Size (Index):    128 (43)

Index    Estimated Time   Temperature Celsius
  44    2019-01-01 03:26    37  ******************
 ...    ..( 15 skipped).    ..  ******************
  60    2019-01-01 03:42    37  ******************
  61    2019-01-01 03:43    36  *****************
 ...    ..( 20 skipped).    ..  *****************
  82    2019-01-01 04:04    36  *****************
  83    2019-01-01 04:05    35  ****************
 ...    ..(  2 skipped).    ..  ****************
  86    2019-01-01 04:08    35  ****************
  87    2019-01-01 04:09    36  *****************
  88    2019-01-01 04:10    36  *****************
  89    2019-01-01 04:11    35  ****************
 ...    ..( 40 skipped).    ..  ****************
   2    2019-01-01 04:52    35  ****************
   3    2019-01-01 04:53    36  *****************
 ...    ..(  4 skipped).    ..  *****************
   8    2019-01-01 04:58    36  *****************
   9    2019-01-01 04:59    37  ******************
 ...    ..( 30 skipped).    ..  ******************
  40    2019-01-01 05:30    37  ******************
  41    2019-01-01 05:31    36  *****************
  42    2019-01-01 05:32    36  *****************
  43    2019-01-01 05:33    36  *****************

SCT Error Recovery Control:
           Read: Disabled
          Write: Disabled

Device Statistics (GP Log 0x04)
Page  Offset Size        Value Flags Description
0x01  =====  =               =  ===  == General Statistics (rev 2) ==
0x01  0x008  4               8  ---  Lifetime Power-On Resets
0x01  0x018  6      1598892472  ---  Logical Sectors Written
0x01  0x020  6         1386302  ---  Number of Write Commands
0x01  0x028  6      3655763419  ---  Logical Sectors Read
0x01  0x030  6         7494155  ---  Number of Read Commands
0x03  =====  =               =  ===  == Rotating Media Statistics (rev 1) ==
0x03  0x008  4             520  ---  Spindle Motor Power-on Hours
0x03  0x010  4             520  ---  Head Flying Hours
0x03  0x018  4              16  ---  Head Load Events
0x03  0x020  4               0  ---  Number of Reallocated Logical Sectors
0x03  0x028  4               0  ---  Read Recovery Attempts
0x03  0x030  4               0  ---  Number of Mechanical Start Failures
0x04  =====  =               =  ===  == General Errors Statistics (rev 1) ==
0x04  0x008  4               0  ---  Number of Reported Uncorrectable Errors
0x04  0x010  4               0  ---  Resets Between Cmd Acceptance and Completion
0x05  =====  =               =  ===  == Temperature Statistics (rev 1) ==
0x05  0x008  1              37  ---  Current Temperature
0x05  0x010  1              35  N--  Average Short Term Temperature
0x05  0x018  1               -  N--  Average Long Term Temperature
0x05  0x020  1              56  ---  Highest Temperature
0x05  0x028  1              22  ---  Lowest Temperature
0x05  0x030  1              41  N--  Highest Average Short Term Temperature
0x05  0x038  1              25  N--  Lowest Average Short Term Temperature
0x05  0x040  1               -  N--  Highest Average Long Term Temperature
0x05  0x048  1               -  N--  Lowest Average Long Term Temperature
0x05  0x050  4               0  ---  Time in Over-Temperature
0x05  0x058  1              60  ---  Specified Maximum Operating Temperature
0x05  0x060  4               0  ---  Time in Under-Temperature
0x05  0x068  1               0  ---  Specified Minimum Operating Temperature
0x06  =====  =               =  ===  == Transport Statistics (rev 1) ==
0x06  0x008  4              60  ---  Number of Hardware Resets
0x06  0x010  4              13  ---  Number of ASR Events
0x06  0x018  4               0  ---  Number of Interface CRC Errors
                                |||_ C monitored condition met
                                ||__ D supports DSN
                                |___ N normalized value

SATA Phy Event Counters (GP Log 0x11)
ID      Size     Value  Description
0x0001  2            0  Command failed due to ICRC error
0x0002  2            0  R_ERR response for data FIS
0x0003  2            0  R_ERR response for device-to-host data FIS
0x0004  2            0  R_ERR response for host-to-device data FIS
0x0005  2            0  R_ERR response for non-data FIS
0x0006  2            0  R_ERR response for device-to-host non-data FIS
0x0007  2            0  R_ERR response for host-to-device non-data FIS
0x0009  2            1  Transition from drive PhyRdy to drive PhyNRdy
0x000a  2            2  Device-to-host register FISes sent due to a COMRESET
0x000b  2            0  CRC errors within host-to-device FIS
0x000d  2            0  Non-CRC errors within host-to-device FIS

如您所见,驱动器的开机时间为520(这是准确的,因为我已经用了不到一个月的时间),但是这两个错误表示它们分别在10610小时和16878小时发生-显然是不可能的。

这里发生了什么事? 错误是真的吗?令人担忧吗?我的供应商会在这里进行某种“里程表篡改”吗?


更新资料

(我早就知道了,但是HGST Western Digital :/确实无济于事(如果他们根本不保留任何有关它们的信息,为什么要给OEM驱动器序列号?),而且响应速度也很慢。)

当我安装这些标签时,我注意到它们的标签上没有像以前那样的标签上的生产日期,但我只是想让制造商不要再打印它们了,于是再也没有想到……我看到了Deltik的好答案。 在我看来,这些并没有(或可以有效地消除)。

在尝试从制造商(新所有者)那里获得官方认可的尝试失败后,我将它们全部拉开,并以最大设置将平板扫描仪对准了他们。通过进行旧的缩放和增强,我能够发现每一个被擦除的证据。这是一个易于阅读的示例:

(原谅5717×8117px,64.0MB .png宽恕)

精简的.jpg概述:

精简的.jpg概述

犯罪现场的原始分辨率为.png(标签的右上角):

原始分辨率裁剪为犯罪现场的.png(标签的右上角)

那些眼神敏锐的人也许已经可以阅读它,但这是一个自动级别的矩形:

自动级别的矩形

是的。所有这些驱动器都有这种故意欺骗的痕迹,它们都是从2015年3月/ 4月/ 5月开始的。在2018年11月底,“新”含义还不完全。

此外,就像其他评论者一样,我很震惊SMART可以被这样颠覆。如果可以重设,它的大部分要点是否就没有了?

我会进一步追求的,相信我。关注此空间。


4
16.8万小时的时间是否与标签上的生产日期一致?还是该错误来自驱动器制造之前?
Peter Cordes

2
@PeterCordes,现在我们可以看到他们尝试隐藏的日期,它们确实是一致的。
阿塔里奥

Answers:


129

我认为您对“里程表篡改”的怀疑是正确的,并且有可能。记录的错误可能是真实的,而且绝对令人担忧,因为它们在读取时会指示坏扇区。磁盘在移交给您之前可能已擦除,因此这些坏扇区可能已被重新映射。

卖给您硬盘驱动器的人都会重置SMART属性,以使其看起来像新的硬盘驱动器。


轶事

2015年7月25日,我从goHardDrive.com购买了六个非常相似的硬盘。当我检查所有磁盘时,我经历了几乎完全相同的症状:

root@box52:~# smartctl -a /dev/sdb
smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-57-generic] (local build)
Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Hitachi Deskstar 7K2000
Device Model:     Hitachi HDS722020ALA330
Serial Number:    JK1101B9G7U8NF
LU WWN Device Id: 5 000cca 222c38d7e
Firmware Version: JKAOA3MA
User Capacity:    2,000,398,934,016 bytes [2.00 TB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    7200 rpm
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA8-ACS T13/1699-D revision 4
SATA Version is:  SATA 2.6, 3.0 Gb/s
Local Time is:    Thu Jul 30 13:57:13 2015 CDT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART STATUS RETURN: incomplete response, ATA output registers missing
SMART overall-health self-assessment test result: PASSED
Warning: This result is based on an Attribute check.

General SMART Values:
Offline data collection status:  (0x80) Offline data collection activity
                                        was never started.
                                        Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0) The previous self-test routine completed
                                        without error or no self-test has ever
                                        been run.
Total time to complete Offline
data collection:                (23653) seconds.
Offline data collection
capabilities:                    (0x5b) SMART execute Offline immediate.
                                        Auto Offline data collection on/off support.
                                        Suspend Offline collection upon new
                                        command.
                                        Offline surface scan supported.
                                        Self-test supported.
                                        No Conveyance Self-test supported.
                                        Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                                        power-saving mode.
                                        Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                                        General Purpose Logging supported.
Short self-test routine
recommended polling time:        (   1) minutes.
Extended self-test routine
recommended polling time:        ( 394) minutes.
SCT capabilities:              (0x003d) SCT Status supported.
                                        SCT Error Recovery Control supported.
                                        SCT Feature Control supported.
                                        SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   016    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   100   100   054    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0007   100   100   024    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0012   100   100   000    Old_age   Always       -       1
  5 Reallocated_Sector_Ct   0x0033   100   100   005    Pre-fail  Always       -       2
  7 Seek_Error_Rate         0x000b   100   100   067    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   020    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0012   100   100   000    Old_age   Always       -       0
 10 Spin_Retry_Count        0x0013   100   100   060    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       1
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       1
193 Load_Cycle_Count        0x0012   100   100   000    Old_age   Always       -       1
194 Temperature_Celsius     0x0002   206   206   000    Old_age   Always       -       29 (Min/Max 25/29)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       2
197 Current_Pending_Sector  0x0022   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0008   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x000a   200   200   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 2
        CR = Command Register [HEX]
        FR = Features Register [HEX]
        SC = Sector Count Register [HEX]
        SN = Sector Number Register [HEX]
        CL = Cylinder Low Register [HEX]
        CH = Cylinder High Register [HEX]
        DH = Device/Head Register [HEX]
        DC = Device Command Register [HEX]
        ER = Error register [HEX]
        ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 31311 hours (1304 days + 15 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 ff 01 58 5d 08  Error: UNC 255 sectors at LBA = 0x085d5801 = 140335105

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 00 58 5d 40 00   9d+05:13:00.528  READ DMA EXT
  25 00 00 00 57 5d 40 00   9d+05:12:59.801  READ DMA EXT
  25 00 00 00 56 5d 48 00   9d+05:12:59.797  READ DMA EXT
  25 00 00 00 55 5d 48 00   9d+05:12:59.794  READ DMA EXT
  25 00 00 00 54 5d 48 00   9d+05:12:59.789  READ DMA EXT

Error 1 occurred at disk power-on lifetime: 31243 hours (1301 days + 19 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 ff 01 58 5d 08  Error: UNC 255 sectors at LBA = 0x085d5801 = 140335105

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  25 00 00 00 58 5d 40 00  41d+18:29:24.394  READ DMA EXT
  25 00 00 00 57 5d 48 00  41d+18:29:24.388  READ DMA EXT
  25 00 00 00 56 5d 40 00  41d+18:29:24.383  READ DMA EXT
  25 00 00 00 55 5d 40 00  41d+18:29:24.376  READ DMA EXT
  25 00 00 00 54 5d 40 00  41d+18:29:24.371  READ DMA EXT

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%         0         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

如果不是因为SMART错误而忘记擦除还是无法擦除,我将坚信我购买的磁盘是新磁盘。

可疑的是,我给日立环球存储技术公司打电话,得知至少有两个磁盘的保修于2010年9月24日激活,这距我购买它们差不多五年了。制造商的保修期在3年后到期。

在对卖方的投诉中,我写道:

删除SMART属性值就像将汽车的里程表归零。删除SMART属性的一个大问题是像我这样的最终用户无法识别扇区是否已重新分配。从没有重新分配的扇区到所有重新分配的备用扇区,都有可能存在。考虑到这些驱动器已经使用了将近五年,至少有一个驱动器上电的时间超过了73.7%,因此很可能是我不知道的重新映射的扇区。

goHardDrive.com已向我出售了至少一个有故障的硬盘驱动器,有意消除了所有六个硬盘驱动器的运行历史,并且在销售时未透露任何硬盘驱动器的使用性质。

我还拍摄了硬盘驱动器的照片:

来自goHardDrive.com的粗略硬盘驱动器–图像底部的硬盘驱动器是参考驱动器。

图像底部的硬盘驱动器是同一制造商的参考磁盘。

请注意,参考磁盘已APR-2012打印在其上,显示了其制造时间。生产日期已从我购买的六个磁盘中删除,但还不够好。看中间的磁盘,您可以在那里淡淡地辨认出来AUG-2010

这肯定可以确认磁盘的历史记录:我购买了已重置其“里程表”的二手硬盘。

最后,卖方接受了我的退货请求,然后我将所有磁盘退回,要求全额退款。

小心购买的硬盘!最好检查一下它们是否有残留的磨损痕迹。


34
哦,很好的答案。我不知道您可以重置SMART属性。我从没买过二手磁盘,现在也无意这样做:)
DavidPostill

31
据推测,这种行为也违反了贸易法,因为它们的行为基本上是误导/欺诈。您是否考虑进一步处理此事?
在轨道进行的轻度比赛

13
@DavidPostill:显然,Dertik也没有这样做的意图,但是是粗略供应商欺诈行为的受害者。
R.,

12
@Deltik我有点担心这种行为可能会继续发生而未报道,这会伤害到谁知道有多少诚实的消费者。
在轨道进行轻度比赛

18
我的朋友不小心重新格式化了他的“新” SD卡,并丢失了他的圣诞节照片-因此我在上面运行了恢复工具,并恢复了200张我们从未见过的人的照片!还要注意SDRAM-制造商ID只是存储在PCB上的串行PROM中,可以编程说什么-如果他们拼写错误的“ Samsung”,这很明显
Rodney
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